USE OF MICROWAVE TECHNIQUES FOR MEASURING CARRIER LIFETIME AND MOBILITY IN SEMICONDUCTORS

被引：11
|
作者：
BROUSSEAU, M
SCHUTTLER, R
机构：
来源：
SOLID-STATE ELECTRONICS | 1969年 / 12卷 / 05期
关键词：
D O I：
10.1016/0038-1101(69)90099-9
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：417 / +
页数：1
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