SPECIAL-ANGLE-OF-INCIDENCE ELLIPSOMETRY FOR UNIAXIAL CRYSTALS .2. POSITIVE-CRYSTALS

In this part of the communication we present a novel method to characterize a positive uniaxial crystal by ellipsometry. We detect the angle of incidence at which a linearly polarized laser beam is reflected linearly polarized, at a certain orientation angle. Also, at this angle of incidence we measure the s-reflectance, the component perpendicular to the plane of incidence. We develop simple expressions to obtain the ordinary N//o and extraordinary N//e refractive indices. A detailed error analysis is presented showing the high accuracy of the method.