OPTICAL EMISSION SPECTROGRAPHIC METHOD FOR ANALYSIS OF MICROGRAM DEPOSITS ON ELECTRON TUBE PARTS

被引：0
|
作者：
LIEBMAN, AM
机构：
来源：
ANALYTICAL CHEMISTRY | 1962年 / 34卷 / 11期
关键词：
D O I：
10.1021/ac60191a006
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：1370 / &
相关论文
共 50 条
  • [41] Optical design and synthetic analysis of the electron cyclotron emission imaging diagnostic of HL-2M tokamak
    Jiang, Min
    Zhu, Yilun
    Yu, Xin
    Shi, Zhongbing
    Luhmann, N. C.
    Yang, Zhoujun
    Deng, Weichu
    Yang, Zengchen
    Zhou, Yu
    Tong, Ruihai
    FUSION ENGINEERING AND DESIGN, 2023, 191
  • [42] Development of Numerical Analysis Method for Cathode Sheath Considering Electron Emission From Cathode in Vacuum Arc
    Takagi, Masahiro
    Suzuki, Hiroto
    Suzuki, Yuki
    Nemoto, Yusuke
    Iwao, Toru
    Nakajima, Tatsuhito
    ELECTRONICS AND COMMUNICATIONS IN JAPAN, 2024, 107 (04)
  • [43] Development of Numerical Analysis Method for Cathode Sheath Considering Electron Emission from Cathode in Vacuum Arc
    Takagi M.
    Suzuki H.
    Suzuki Y.
    Nemoto Y.
    Iwao T.
    Nakajima T.
    IEEJ Transactions on Fundamentals and Materials, 2024, 144 (07) : 272 - 279
  • [44] The analysis of the influence of limiting factors in the method of differential scattering in the control of surface inhomogeneities of the subnanometer level of the profiles of optical parts
    Denisov D.G.
    Applied Physics, 2022, (01): : 89 - 96
  • [45] The Importance of Method Development for Trace-Element Analysis by Inductively Coupled Plasma Optical Emission Spectroscopy
    Rury, Maura
    SPECTROSCOPY, 2016, 31 (05) : 16 - 32
  • [46] The importance of method development for trace-element analysis by inductively coupled plasma - Optical emission spectroscopy
    Rury, Maura (maura.rury@thermofisher.com), 1600, Advanstar Communications Inc. (31):
  • [47] Application of differential algebraic method to the aberration analysis of curvilinear-axis electron optical systems
    Wang, LP
    Tang, TT
    Cheng, BJ
    Cleaver, JRA
    OPTIK, 2002, 113 (04): : 171 - 176
  • [48] Application of differential algebraic method to the aberration analysis of curvilinear-axis electron optical systems
    Wang, L.-P.
    Tang, T.-T.
    Cheng, B.-J.
    Cleaver, J.R.A.
    Optik (Jena), 2002, 113 (04): : 171 - 176
  • [49] Erosion characteristics analysis of molybdenum grid in ion thrusters based on optical emission spectroscopy method and actinometry
    Zhu, Xi-Ming
    Zheng, Bo-Wen
    Xi, Wei
    Wang, Yan-Fei
    Kang, Yong-Qi
    Yu, Da-Ren
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2024, 220
  • [50] EVALUATION OF INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY AS A METHOD FOR ELEMENTAL ANALYSIS OF ORGANIC-COMPOUNDS
    WINDSOR, DL
    DENTON, MB
    APPLIED SPECTROSCOPY, 1978, 32 (04) : 366 - 371
12345