TESTING FLASH A/D CONVERTERS

被引:0
|
作者
不详
机构
来源
ELECTRONIC ENGINEERING | 1987年 / 59卷 / 731期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:131 / &
相关论文
共 50 条
  • [41] Simultaneous Static Testing of A/D and D/A Converters Using a Built-in Structure
    Kim, Incheol
    Jang, Jaewon
    Son, HyeonUk
    Park, Jaeseok
    Kang, Sungho
    ETRI JOURNAL, 2013, 35 (01) : 109 - 119
  • [42] CHARACTERIZING AND TESTING A-D AND D-A CONVERTERS FOR COLOR VIDEO APPLICATIONS
    KESTER, WA
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1978, 25 (07): : 539 - 550
  • [43] Testing of embedded A/D converters in mixed-signal circuit
    BenHamida, N
    Ayari, B
    Kaminska, B
    INTERNATIONAL CONFERENCE ON COMPUTER DESIGN - VLSI IN COMPUTERS AND PROCESSORS, PROCEEDINGS, 1996, : 135 - 136
  • [44] Dynamic Testing of A/D Converters Using the Multiple Coherence Function
    Richards, Troy C.
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2008, 57 (11) : 2596 - 2607
  • [45] Principles of optimisation, modelling and testing of intelligent cyclic A/D converters
    Platonov, AA
    Jedrzejewski, K
    Malkiewicz, LM
    Jasnos, J
    MEASUREMENT, 2006, 39 (03) : 213 - 231
  • [46] Linearity Testing of A/D Converters Using Selective Code Measurement
    Shalabh Goyal
    Abhijit Chatterjee
    Journal of Electronic Testing, 2008, 24 : 567 - 576
  • [47] Dynamic testing of A/D converters using the multiple coherence function
    Richards, Troy C.
    2006 IEEE Instrumentation and Measurement Technology Conference Proceedings, Vols 1-5, 2006, : 1648 - 1653
  • [48] DYNAMIC TESTING OF HIGH-SPEED A-D CONVERTERS
    PRETZL, G
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1978, 13 (03) : 368 - 371
  • [49] Linearity Testing of A/D Converters Using Selective Code Measurement
    Goyal, Shalabh
    Chatterjee, Abhijit
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2008, 24 (06): : 567 - 576
  • [50] Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling
    Athanasios Stefanou
    Georges Gielen
    Analog Integrated Circuits and Signal Processing, 2010, 65 : 185 - 195