FLASHOVER TESTS ON DUST-CONTAMINATED INSULATORS

被引：5

|

作者：

RIZK, FAM

ASSAAD, AA

机构：

来源：

IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS | 1972年 / PA91卷 / 01期

关键词：

D O I：

10.1109/TPAS.1972.293367

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：328 / &

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