FLASHOVER TESTS ON DUST-CONTAMINATED INSULATORS

被引：5
|
作者：
RIZK, FAM
ASSAAD, AA
机构：
来源：
IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS | 1972年 / PA91卷 / 01期
关键词：
D O I：
10.1109/TPAS.1972.293367
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：328 / &
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