共 50 条
- [1] APPLICATION OF ION-INDUCED X-RAY-EMISSION FOR MEASUREMENT OF STOPPING POWERS BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (08): : 1061 - 1061
- [3] MEASUREMENTS OF STOPPING POWERS USING PROTON-INDUCED X-RAY-EMISSION BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1976, 21 (05): : 817 - 817
- [4] ION-INDUCED CHARACTERISTIC X-RAY-EMISSION IN SOLIDS PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1987, 139 (01): : 17 - 57
- [5] APPLICATIONS OF SIMULTANEOUS ION BACKSCATTERING AND ION-INDUCED X-RAY-EMISSION NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 420 - 424
- [6] INFLUENCE OF TOPOGRAPHY OF A SAMPLE IN ION-INDUCED X-RAY-EMISSION ANALYSIS ISOTOPENPRAXIS, 1977, 13 (04): : 133 - 135
- [7] ION-INDUCED M X-RAY-EMISSION FROM HEAVY LANTHANIDES NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1987, 262 (01): : 144 - 149
- [8] ION-INDUCED X-RAY-EMISSION - PARAMETER SET FOR ATTENUATION CORRECTIONS ISOTOPENPRAXIS, 1986, 22 (01): : 12 - 16
- [9] ION-INDUCED X-RAY-EMISSION AND ELECTRON-MICROSCOPY FOR THE INVESTIGATION OF MICROPARTICLES NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1994, 85 (1-4): : 845 - 848
- [10] DEPTH PROFILE MEASUREMENTS OF COPPER IN SILICON BY ION-INDUCED X-RAY-EMISSION RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1980, 49 (1-3): : 107 - 111