Critical current density of high quality YBa2Cu3O7 thin films determined from AC magnetic susceptibility

被引：0

作者：

Schroeder, J ^{[1
]}

Mehbod, M ^{[1
]}

Ye, M ^{[1
]}

Deltour, R ^{[1
]}

Pozigun, S ^{[1
]}

Kazin, PE ^{[1
]}

机构：

[1] MOSCOW MV LOMONOSOV STATE UNIV,DEPT CHEM,MOSCOW 119899,RUSSIA

来源：

APPLIED SUPERCONDUCTIVITY 1995, VOLS. 1 AND 2: VOL 1: PLENARY TALKS AND HIGH CURRENT APPLICATIONS; VOL 2: SMALL SCALE APPLICATIONS | 1995年 / 148卷

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D O I：

暂无

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In the following paper, we present a non-destructive method to determine the temperature dependence of the critical current densities from standard AC susceptibility measurements. This method, which is based on the critical state model, is applied to high quality YBa2Cu3O7-delta thin films with very high critical current densities (4-8x10(6)A/cm(2) at 77K). The obtained results are compared to the determination of J(c) by a standard four contact method. A good agreement between these two methods has been found from T-c to 77K.

引用

页码：983 / 986

页数：4

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