MEASUREMENT METHOD OF ADHESION STRENGTH BETWEEN INORGANIC MATERIALS AND POLYMER BY USING ATOMIC-FORCE MICROSCOPY

被引:0
|
作者
KAWAI, A [1 ]
NAGATA, H [1 ]
TAKATA, M [1 ]
机构
[1] MITSUBISHI ELECTR CORP,ULSI LAB,ITAMI,HYOGO 664,JAPAN
关键词
ATOMIC FORCE MICROSCOPY; SURFACE FORCE; ADHESION; ELASTIC ENERGY; DESTRUCTION; PHOTORESIST; CANTILEVER TIP;
D O I
暂无
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A new application of the interaction phenomenon between tip and surface to practical adhesive behavior is studied. The interactive energy between two films can be estimated from the measured data of attractive force by atomic force microscopy (AFM). The adhesive strength between inorganic materials and polymer is closely related to the estimated value of interactive energy. The adhesive strength can be estimated by using a nondestructive method.
引用
收藏
页码:1102 / 1104
页数:3
相关论文
共 50 条
  • [31] NANOMETER MODIFICATIONS OF NONCONDUCTIVE MATERIALS USING RESIST-FILMS BY ATOMIC-FORCE MICROSCOPY
    YAMAMOTO, S
    YAMADA, H
    TOKUMOTO, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (6B): : 3396 - 3399
  • [32] DIRECT MEASUREMENT OF THE DEPLETION FORCE USING AN ATOMIC-FORCE MICROSCOPE
    MILLING, A
    BIGGS, S
    JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1995, 170 (02) : 604 - 606
  • [33] Measurement of the strength of adhesion of resist patterns using an atomic force microscope
    Kim, SK
    Jung, MH
    Kim, HW
    Woo, SG
    Lee, H
    NANOTECHNOLOGY, 2005, 16 (10) : 2227 - 2232
  • [34] STERIC AND BRIDGING FORCES BETWEEN SURFACES FEARING ADSORBED POLYMER - AN ATOMIC-FORCE MICROSCOPY STUDY
    BIGGS, S
    LANGMUIR, 1995, 11 (01) : 156 - 162
  • [35] Investigation of adhesion properties of polymer materials by atomic force microscopy and zeta potential measurements
    Weidenhammer, P
    Jacobasch, HJ
    JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1996, 180 (01) : 232 - 236
  • [36] ULTRATHIN POLYMER-COATINGS INVESTIGATED BY ATOMIC-FORCE MICROSCOPY AND ELLIPSOMETRY
    GESANG, T
    FANTER, D
    HOPER, R
    POSSART, W
    HENNEMANN, OD
    VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 1994, (272): : 350 - 353
  • [37] CHARACTERIZATION OF METAL-POLYMER INTERFACES BY XPS AND ATOMIC-FORCE MICROSCOPY
    JUGNET, Y
    DUC, TM
    VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 1993, (268): : 100 - 101
  • [38] AN ATOMIC-FORCE MICROSCOPY STUDY OF THE WETTING OF AN INORGANIC SURFACE BY LATEX-PARTICLES
    GRANIER, V
    SARTRE, A
    JOANICOT, M
    JOURNAL OF ADHESION, 1993, 42 (04): : 255 - &
  • [39] Study of adhesion of vertically aligned carbon nanotubes to a substrate by atomic-force microscopy
    O. A. Ageev
    Yu. F. Blinov
    M. V. Il’ina
    O. I. Il’in
    V. A. Smirnov
    O. G. Tsukanova
    Physics of the Solid State, 2016, 58 : 309 - 314
  • [40] Study of Adhesion of Vertically Aligned Carbon Nanotubes to a Substrate by Atomic-Force Microscopy
    Ageev, O. A.
    Blinov, Yu. F.
    Il'ina, M. V.
    Il'in, O. I.
    Smirnov, V. A.
    Tsukanova, O. G.
    PHYSICS OF THE SOLID STATE, 2016, 58 (02) : 309 - 314