共 50 条
- [23] Si and SiC Schottky diodes in smart power circuits: A comparative study by I-V-T and C-V measurements Second Conference on Microelectronics, Microsystems and Nanotechnology, 2005, 10 : 11 - 14
- [26] FLUCTUATION OF FIXED OXIDE CHARGE IN MIS STRUCTURES AND C-V MEASUREMENTS DOKLADI NA BOLGARSKATA AKADEMIYA NA NAUKITE, 1973, 26 (10): : 1311 - 1314
- [27] NEW TECHNIQUE FOR AUTOMATIC C-V AND G-V MEASUREMENTS JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (03): : 328 - 334
- [28] Automatic plotter of volt-farad characteristics of semiconductor structures (C-V curve tracer) Instruments and experimental techniques New York, 1988, 31 (3 pt 2): : 786 - 791