MAXIMUM-ENTROPY IMAGE DECONVOLUTION IN HIGH-RESOLUTION ELECTRON-MICROSCOPY

The principle of image deconvolution in HREM by means of maximum entropy (ME) is introduced. The ME image deconvolution was performed in terms of a single image taken at an arbitrary defocus condition or in terms of the combination of an image with the corresponding electron diffraction pattern. The weighted ME method is introduced for crystals thicker than a weak phase object. The test results on simulated images of chlorinated-copper phthalocyanine for various defocus values are shown. The method is also efficient for crystals consisting of atoms with great differences in atomic weight and for very noisy images.