INSITU X-RAY-DIFFRACTION MEASUREMENT OF THIN-FILM TRANSFORMATION KINETICS USING A LINEAR POSITION-SENSITIVE DETECTOR

被引：0

作者：

CHEN, H ^{[1
]}

LITTLE, TW ^{[1
]}

机构：

[1] UNIV ILLINOIS,DEPT MAT SCI & ENGN,URBANA,IL 61801

来源：

JOURNAL OF METALS | 1987年 / 39卷 / 10期

关键词：

D O I：

暂无

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：A25 / A25

页数：1

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