FAST FOURIER TRANSFORMED ELECTRONIC SPECKLE CONTOURING FOR DIFFUSE SURFACES PROFILOMETRY

被引：9
|
作者：
PAOLETTI, D
SPAGNOLO, GS
机构：
[1] Dipartimento di Energetica, Università Dell'Aquila, Località Monteluco di Roio, 67040 Roio Poggio, AQ
来源：
OPTICS AND LASERS IN ENGINEERING | 1994年 / 20卷 / 02期
关键词：
D O I：
10.1016/0143-8166(94)90019-1
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A method of contouring three-dimensional objects using an out-of-plane sensitive ESPI apparatus with optical fibers is presented. The contour map is obtained by shifting the object illumination beam. A Fourier transform method is suggested for automatic quantitative analysis of specklecorrelograms in terms of phase. An example of application is presented.
引用
收藏
页码：87 / 96
页数：10
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