ELECTRON-DIFFRACTION STUDY OF SUPERCOOLING PHENOMENA ON DIFFERENT METALLIC THIN-FILMS

被引：0

作者：

BERTY, J

DAVID, MJ

LAFOURCADE, L

机构：

来源：

JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1978年 / 3卷 / 03期

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暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：211 / 224

页数：14

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[21] ELLIPTIC ELECTRON-DIFFRACTION PATTERNS FROM THIN-FILMS OF TURBOSTRATIC GRAPHITE
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[29] ELECTRON-DIFFRACTION ANALYSIS OF THE GROWTH OF HYDROGENATED AMORPHOUS-SILICON THIN-FILMS
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