CHARACTERIZATION OF MOCVD PBTIO3 THIN-FILMS

被引：36
|
作者：
SWARTZ, SL [1 ]
SEIFERT, DA [1 ]
NOEL, GT [1 ]
SHROUT, TR [1 ]
机构：
[1] PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
来源：
FERROELECTRICS | 1989年 / 93卷
关键词：
D O I：
10.1080/00150198908017318
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：37 / 43
页数：7
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