THE SIO2-SI3N4 INTERFACE .2. O-2 PERMEATION AND OXIDATION REACTION

被引:42
|
作者
OGBUJI, LUJT
机构
[1] NYMA, NASA Lewis Research Center, Cleveland, Ohio
关键词
D O I
10.1111/j.1151-2916.1995.tb08482.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Previous analyses of Si3N4 oxidation on the basis of diffusion control by a suboxide layer yielded impossibly high N-2 pressures. Those models assumed interfacial reactions as the oxidation mechanism. However, it is now thought that the oxidation process is in situ substitution of O for N in silicon oxynitride of graded composition rather than interfacial reaction. In this paper, diffusional and thermodynamic analyses appropriate to this mode of oxidation are developed for both the permeation and reaction aspects of oxidation; O-2 diffusivities are calculated from permeation energies;gas pressures in the oxide are derived from solution thermodynamics and found to be moderate.
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页码:1279 / 1284
页数:6
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