FEEDBACK STABILIZATION OF FIELD-EMISSION PROBE CURRENT

被引:0
|
作者
NOMURA, S
KOMODA, T
KAMIRYO, T
NAKAIZUM.Y
机构
[1] HITACHI CENT RES LAB,HITACHI,JAPAN
[2] HITACHI NAKA WORKS,HITACHI,JAPAN
来源
JOURNAL OF ELECTRON MICROSCOPY | 1973年 / 22卷 / 03期
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D O I
暂无
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
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页码:281 / 282
页数:2
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