SUBSTRATE RADIATION IN X-RAY ANALYSIS OF THIN SPECIMENS

被引：0
|
作者：
PLESCH, R
机构：
来源：
SIEMENS ZEITSCHRIFT | 1978年 / 52卷 / 02期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：93 / 96
页数：4
相关论文
共 50 条
  • [41] Measurement of stray x-ray radiation as a part of radiation control of x-ray rooms
    Berlyand V.A.
    Volegov P.L.
    Platonov N.N.
    Biomedical Engineering, 1998, 32 (3) : 137 - 139
  • [42] X-RAY SPECTRAL ANALYSIS OF THIN FERRITE FILMS
    BONDAREN.GV
    IVANOVA, LB
    SADILOV, KA
    ZAVODSKAYA LABORATORIYA, 1973, (06): : 688 - 691
  • [43] X-RAY SPECTROMETRIC ANALYSIS OF THIN METALLIC FOILS
    BONDAR, AD
    KAREV, VN
    KLYUCHAREV, AP
    NIKOLAICHUK, AD
    INDUSTRIAL LABORATORY, 1962, 28 (12): : 1544 - 1546
  • [44] X-RAY DIFFRACTION ANALYSIS OF THIN ALUMINA FILMS
    Yakovleva, O. A.
    Yakovlev, A. N.
    Yakovleva, N. M.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 502 - 502
  • [45] X-ray fluorescent analysis using scattered radiation
    A. V. Bakhtiyarov
    Inorganic Materials, 2010, 46 : 1618 - 1626
  • [46] Microstructure and X-ray analysis on LaCaMnO thin film
    Gross, GM
    Praus, RB
    Leibold, B
    Habermeier, HU
    APPLIED SURFACE SCIENCE, 1999, 138 : 117 - 122
  • [47] Microstructure and X-ray analysis on LaCaMnO thin film
    Gross, Gudrun M.
    Praus, Rainer B.
    Leibold, Bernd
    Habermeier, Hanns-Ulrich
    Applied Surface Science, 1999, 138 (1-4): : 117 - 122
  • [48] Synchrotron radiation induced X-ray microfluorescence analysis
    Janssens, K
    Vincze, L
    Vekemans, B
    Aerts, A
    Adams, F
    Jones, KW
    Knochel, A
    MIKROCHIMICA ACTA, 1996, : 87 - 115
  • [49] MULTIPLY SCATTERED RADIATION IN X-RAY RADIOMETRIC ANALYSIS
    BELYKH, VV
    SMAGUNOVA, AN
    KOZLOV, VA
    JOURNAL OF ANALYTICAL CHEMISTRY, 1994, 49 (10) : 980 - 984
  • [50] X-ray fluorescent analysis using scattered radiation
    Bakhtiyarov, A. V.
    INORGANIC MATERIALS, 2010, 46 (15) : 1618 - 1626
12345