local vibrational modes;
point defects in semiconductors;
valence-force model;
interatomic forces;
density-functional theory;
isotope shift;
Si;
GaAs;
ZnS;
Keating-Kane parameters;
intrinsic defects;
phonon dispersion curves;
Raman scattering;
vibration amplitude;
D O I:
10.4028/www.scientific.net/MSF.196-201.1583
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
We present a simple method to calculate local vibrational modes (LVMs) in cubic semiconductors using the valence-force model of Keating and Kane together with Coulomb forces. The vibration frequencies and amplitudes are obtained from the eigenvalues and eigenvectors of the dynamical matrix, respectively. The valence-force parameters of GaAs were obtained from calculations of the interatomic forces by density-functional theory. The resulting phonon dispersion curves are in agreement with neutron scattering experiments and we present the LVM of A(1) symmetry at the As antisite. We calculated the isotope shift of LVMs for the shallow impurities B, C, N in Si and at Ni impurities in ZnS and present a general relation between the mass dependence of a LVM and the relative vibration amplitude of the impurity.
机构:
Semicond Res Fdn, Semicond Res Inst, Aoba Ku, Sendai, Miyagi 9800862, JapanSemicond Res Fdn, Semicond Res Inst, Aoba Ku, Sendai, Miyagi 9800862, Japan
机构:
Semicond Res Fdn, Semicond Res Inst, Kawauchi Aoba Ku, Sendai, Miyagi 9800862, JapanSemicond Res Fdn, Semicond Res Inst, Kawauchi Aoba Ku, Sendai, Miyagi 9800862, Japan