首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
FABRY-PEROT LASER INTERFEROMETRY TO MEASURE REFRACTIVE-INDEX OR THICKNESS OF TRANSPARENT MATERIALS
被引:11
|
作者
:
LUNAZZI, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV NACL LA PLATA, DEPT FIS, LA PLATTA 67, ARGENTINA
UNIV NACL LA PLATA, DEPT FIS, LA PLATTA 67, ARGENTINA
LUNAZZI, JJ
[
1
]
GARAVAGLIA, M
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV NACL LA PLATA, DEPT FIS, LA PLATTA 67, ARGENTINA
UNIV NACL LA PLATA, DEPT FIS, LA PLATTA 67, ARGENTINA
GARAVAGLIA, M
[
1
]
机构
:
[1]
UNIV NACL LA PLATA, DEPT FIS, LA PLATTA 67, ARGENTINA
来源
:
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS
|
1973年
/ 6卷
/ 03期
关键词
:
D O I
:
10.1088/0022-3735/6/3/013
中图分类号
:
TH7 [仪器、仪表];
学科分类号
:
0804 ;
080401 ;
081102 ;
摘要
:
引用
收藏
页码:237 / 240
页数:4
相关论文
共 50 条
[31]
In-line Fabry-Perot refractive index sensor based on microcavity
Xu, Feng
论文数:
0
引用数:
0
h-index:
0
机构:
Anhui Univ, Sch Phys & Mat Sci, Hefei 230601, Peoples R China
Anhui Univ, Sch Phys & Mat Sci, Hefei 230601, Peoples R China
Xu, Feng
Lu, Lu
论文数:
0
引用数:
0
h-index:
0
机构:
Anhui Univ, Sch Phys & Mat Sci, Hefei 230601, Peoples R China
Anhui Univ, Sch Phys & Mat Sci, Hefei 230601, Peoples R China
Lu, Lu
Lu, Weiwei
论文数:
0
引用数:
0
h-index:
0
机构:
Anhui Univ, Sch Phys & Mat Sci, Hefei 230601, Peoples R China
Anhui Univ, Sch Phys & Mat Sci, Hefei 230601, Peoples R China
Lu, Weiwei
Yu, Benli
论文数:
0
引用数:
0
h-index:
0
机构:
Anhui Univ, Sch Phys & Mat Sci, Hefei 230601, Peoples R China
Anhui Univ, Sch Phys & Mat Sci, Hefei 230601, Peoples R China
Yu, Benli
CHINESE OPTICS LETTERS,
2013,
11
(08)
[32]
Measuring the thickness profiles of wafers to subnanometer resolution using Fabry-Perot interferometry
Farrant, David I.
论文数:
0
引用数:
0
h-index:
0
机构:
CSIRO, Lindfield, NSW 2070, Australia
CSIRO, Lindfield, NSW 2070, Australia
Farrant, David I.
Arkwright, John W.
论文数:
0
引用数:
0
h-index:
0
机构:
CSIRO, Lindfield, NSW 2070, Australia
CSIRO, Lindfield, NSW 2070, Australia
Arkwright, John W.
Fairman, Philip S.
论文数:
0
引用数:
0
h-index:
0
机构:
CSIRO, Lindfield, NSW 2070, Australia
CSIRO, Lindfield, NSW 2070, Australia
Fairman, Philip S.
Netterfield, Roger P.
论文数:
0
引用数:
0
h-index:
0
机构:
CSIRO, Lindfield, NSW 2070, Australia
CSIRO, Lindfield, NSW 2070, Australia
Netterfield, Roger P.
APPLIED OPTICS,
2007,
46
(15)
: 2863
-
2869
[33]
MEASURING REFRACTIVE-INDEX AND THICKNESS OF THIN TRANSPARENT FILMS - METHOD
DANEU, V
论文数:
0
引用数:
0
h-index:
0
机构:
INST ELETTROTEC,VIALE SCI,PALERMO,ITALY
INST ELETTROTEC,VIALE SCI,PALERMO,ITALY
DANEU, V
SANCHEZ, A
论文数:
0
引用数:
0
h-index:
0
机构:
INST ELETTROTEC,VIALE SCI,PALERMO,ITALY
INST ELETTROTEC,VIALE SCI,PALERMO,ITALY
SANCHEZ, A
APPLIED OPTICS,
1974,
13
(01):
: 122
-
128
[34]
REFRACTIVE-INDEX AND THICKNESS DETERMINATION OF TRANSPARENT FILMS - AN INTERFERENCE METHOD
ABRAHAM, M
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ORAN,INST SCI EXACTES,DEPT PHYS,ORAN,ALGERIA
UNIV ORAN,INST SCI EXACTES,DEPT PHYS,ORAN,ALGERIA
ABRAHAM, M
THIN SOLID FILMS,
1983,
109
(02)
: 93
-
102
[35]
MEASUREMENT OF FIELD-INDUCED REFRACTIVE-INDEX VARIATION IN GAAS ALGAAS SUPERLATTICE USING MONOLITHIC FABRY-PEROT ETALON
LAW, KK
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,HOLMDEL,NJ 07733
AT&T BELL LABS,HOLMDEL,NJ 07733
LAW, KK
YAN, RH
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,HOLMDEL,NJ 07733
AT&T BELL LABS,HOLMDEL,NJ 07733
YAN, RH
COLDREN, LA
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,HOLMDEL,NJ 07733
AT&T BELL LABS,HOLMDEL,NJ 07733
COLDREN, LA
MERZ, JL
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,HOLMDEL,NJ 07733
AT&T BELL LABS,HOLMDEL,NJ 07733
MERZ, JL
ELECTRONICS LETTERS,
1991,
27
(02)
: 105
-
106
[36]
MEASUREMENT OF THE REFRACTIVE-INDEX OF SOLIDS WITH THE AID OF A MODULATION FABRY-PEROT-INTERFEROMETER
ETSINA, AL
论文数:
0
引用数:
0
h-index:
0
ETSINA, AL
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES,
1979,
22
(01)
: 182
-
184
[37]
RESONANCES OF FABRY-PEROT LASER
BARONE, SR
论文数:
0
引用数:
0
h-index:
0
BARONE, SR
JOURNAL OF APPLIED PHYSICS,
1963,
34
(04)
: 831
-
+
[38]
Fabry-Perot Gunn laser
Chung, S
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Essex, Dept Elect Syst Engn, Colchester CO4 3SQ, Essex, England
Univ Essex, Dept Elect Syst Engn, Colchester CO4 3SQ, Essex, England
Chung, S
Balkan, N
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Essex, Dept Elect Syst Engn, Colchester CO4 3SQ, Essex, England
Univ Essex, Dept Elect Syst Engn, Colchester CO4 3SQ, Essex, England
Balkan, N
APPLIED PHYSICS LETTERS,
2005,
86
(21)
: 1
-
2
[39]
FABRY-PEROT LASER SPECTROMETER
ATUTOV, SN
论文数:
0
引用数:
0
h-index:
0
ATUTOV, SN
KOCHANOV, VP
论文数:
0
引用数:
0
h-index:
0
KOCHANOV, VP
SAPRYKIN, EG
论文数:
0
引用数:
0
h-index:
0
SAPRYKIN, EG
SMIRNOV, GI
论文数:
0
引用数:
0
h-index:
0
SMIRNOV, GI
OPTIKA I SPEKTROSKOPIYA,
1977,
43
(02):
: 331
-
338
[40]
Clarification of braiding statistics in Fabry-Perot interferometry
Read, Nicholas
论文数:
0
引用数:
0
h-index:
0
机构:
Yale Univ, Dept Phys, New Haven, CT 06520 USA
Yale Univ, Dept Appl Phys, New Haven, CT 06520 USA
Yale Univ, Dept Phys, New Haven, CT 06520 USA
Read, Nicholas
Das Sarma, Sankar
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Maryland, Condensed Matter Theory Ctr, Dept Phys, College Pk, MD USA
Yale Univ, Dept Phys, New Haven, CT 06520 USA
Das Sarma, Sankar
NATURE PHYSICS,
2024,
20
(03)
: 381
-
382
←
1
2
3
4
5
→