STRUCTURAL IMPLICATIONS OF MEASUREMENT ERROR IN SOCIOMETRY

被引：154
|
作者：
HOLLAND, PW
LEINHARDT, S
机构：
[1] HARVARD UNIV, CAMBRIDGE, MA 02138 USA
[2] CARNEGIE MELLON UNIV, PITTSBURGH, PA 15213 USA
来源：
JOURNAL OF MATHEMATICAL SOCIOLOGY | 1973年 / 3卷 / 01期
关键词：
D O I：
10.1080/0022250X.1973.9989825
中图分类号：
O1 [数学];
学科分类号：
0701 ; 070101 ;
摘要：
引用
收藏
页码：85 / 111
页数：27
相关论文
共 50 条
  • [41] A cautionary note on measurement error corrections in structural equation models
    DeShon, RP
    PSYCHOLOGICAL METHODS, 1998, 3 (04) : 412 - 423
  • [42] Multiple Imputation to Account for Measurement Error in Marginal Structural Models
    Edwards, Jessie K.
    Cole, Stephen R.
    Westreich, Daniel
    Crane, Heidi
    Eron, Joseph J.
    Mathews, W. Christopher
    Moore, Richard
    Boswell, Stephen L.
    Lesko, Catherine R.
    Mugavero, Michael J.
    EPIDEMIOLOGY, 2015, 26 (05) : 645 - 652
  • [43] EVALUATING STRUCTURAL EQUATION MODELS WITH UNOBSERVABLE VARIABLES AND MEASUREMENT ERROR
    FORNELL, C
    LARCKER, DF
    JOURNAL OF MARKETING RESEARCH, 1981, 18 (01) : 39 - 50
  • [44] Dietary measurement error and its implications: Results of the OPEN biomarker study
    Kipnis, V
    Subar, A
    Midthune, D
    Freedman, L
    Ballard-Barbash, R
    Troiano, R
    Bingham, S
    Schoeller, D
    Schatzkin, A
    Carroll, R
    FASEB JOURNAL, 2002, 16 (04): : A27 - A27
  • [45] Experimental Evaluation of NISQ Quantum Computers: Error Measurement, Characterization, and Implications
    Patel, Tirthak
    Potharaju, Abhay
    Li, Baolin
    Roy, Rohan Basu
    Tiwari, Devesh
    PROCEEDINGS OF SC20: THE INTERNATIONAL CONFERENCE FOR HIGH PERFORMANCE COMPUTING, NETWORKING, STORAGE AND ANALYSIS (SC20), 2020,
  • [46] MISCLASSIFICATION BIAS ARISING FROM RANDOM ERROR IN EXPOSURE MEASUREMENT - IMPLICATIONS FOR DUAL MEASUREMENT STRATEGIES
    BRENNER, H
    BLETTNER, M
    AMERICAN JOURNAL OF EPIDEMIOLOGY, 1993, 138 (06) : 453 - 461
  • [47] STRUCTURAL EQUATION MODELS WITH UNOBSERVABLE VARIABLES AND MEASUREMENT ERROR - ALGEBRA AND STATISTICS
    FORNELL, C
    LARCKER, DF
    JOURNAL OF MARKETING RESEARCH, 1981, 18 (03) : 382 - 388
  • [48] Precise Image Registration with Structural Similarity Error Measurement Applied to Superresolution
    Amintoosi, Mahmood
    Fathy, Mahmood
    Mozayani, Nasser
    EURASIP JOURNAL ON ADVANCES IN SIGNAL PROCESSING, 2009,
  • [49] Likelihood analysis and flexible structural modeling for measurement error model regression
    Schafer, DW
    JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION, 2002, 72 (01) : 33 - 45
  • [50] Sub-Regional Phase Error Compensation for Structural Light Measurement
    Liu Chao
    Gai Shaoyan
    Da Feipeng
    CHINESE JOURNAL OF LASERS-ZHONGGUO JIGUANG, 2018, 45 (06):
12345