SCANNING TUNNELING MICROSCOPY AT POTENTIAL CONTROLLED ELECTRODE SURFACES IN ELECTROLYTIC ENVIRONMENT

被引：126
|
作者：
LUSTENBERGER, P
ROHRER, H
CHRISTOPH, R
SIEGENTHALER, H
机构：
[1] IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
[2] UNIV BERN,INST ANORGAN ANALYT & PHYS CHEM,CH-3012 BERN,SWITZERLAND
来源：
JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1988年 / 243卷 / 01期
关键词：
D O I：
10.1016/0022-0728(88)85043-5
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：225 / 235
页数：11
相关论文
共 50 条
  • [41] SCANNING-TUNNELING-MICROSCOPY OF RF OSCILLATING SURFACES
    CHILLA, E
    ROHRBECK, W
    FROHLICH, HJ
    KOCH, R
    RIEDER, KH
    ANNALEN DER PHYSIK, 1994, 3 (01) : 21 - 27
  • [42] IMAGING ATOMS AND MOLECULES ON SURFACES BY SCANNING TUNNELING MICROSCOPY
    CHIANG, S
    WILSON, RJ
    JOURNAL OF METALS, 1988, 40 (07): : A25 - A25
  • [43] SCANNING-TUNNELING-MICROSCOPY OF POROUS SILICON SURFACES
    AMISOLA, GB
    BEHRENSMEIER, R
    GALLIGAN, JM
    OTTER, FA
    NAMAVAR, F
    KALKORAN, NM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (05): : 1788 - 1792
  • [44] A scanning tunneling microscopy study of the GaAs(112) surfaces
    Geelhaar, L
    Márquez, J
    Jacobi, K
    Kley, A
    Ruggerone, P
    Scheffler, M
    MICROELECTRONICS JOURNAL, 1999, 30 (4-5) : 393 - 396
  • [45] The structure and reactivity of surfaces revealed by scanning tunneling microscopy
    Flemming Besenbacher
    Peter Thostrup
    Miquel Salmeron
    MRS Bulletin, 2012, 37 : 677 - 681
  • [46] Model catalyst surfaces investigated by scanning tunneling microscopy
    Lauritsen, J. V.
    Besenbacher, F.
    ADVANCES IN CATALYSIS, VOL 50, 2006, 50 : 97 - 147
  • [47] Scanning tunneling microscopy study of the GaAs(112) surfaces
    Geelhaar, L.
    Márquez, J.
    Jacobi, K.
    Kley, A.
    Ruggerone, P.
    Scheffler, M.
    Microelectronics Journal, 30 (04): : 393 - 396
  • [48] SCANNING TUNNELING MICROSCOPY APPLIED TO OPTICAL-SURFACES
    DRAGOSET, RA
    YOUNG, RD
    LAYER, HP
    MIELCZAREK, SR
    TEAGUE, EC
    CELOTTA, RJ
    OPTICS LETTERS, 1986, 11 (09) : 560 - 562
  • [49] PHOTOVOLTAGE ON SILICON SURFACES MEASURED BY SCANNING TUNNELING MICROSCOPY
    KUK, Y
    BECKER, RS
    SILVERMAN, PJ
    KOCHANSKI, GP
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 545 - 550
  • [50] Theory of scanning tunneling microscopy of defects on semiconductor surfaces
    de la Broïse, X
    Delerue, C
    Lannoo, M
    Grandidier, B
    Stiévenard, D
    PHYSICAL REVIEW B, 2000, 61 (03): : 2138 - 2145
12345