CIRCUIT FOR TESTING HIGH-EFFICIENCY IMPATT DIODES

被引：32
|
作者：
IGLESIAS, DE
机构：
来源：
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS | 1967年 / 55卷 / 11期
关键词：
D O I：
10.1109/PROC.1967.6077
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：2065 / &
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