SURFACE STUDIES OF ABSORBING THIN SOLID FILMS

被引:0
|
作者
BOHIDAR, H
CHOPRA, S
机构
关键词
D O I
10.1016/0030-4018(81)90305-9
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:52 / 56
页数:5
相关论文
共 50 条
  • [1] OPTICAL-CONSTANTS OF ABSORBING THIN SOLID FILMS ON A SUBSTRATE
    VRIENS, L
    RIPPENS, W
    APPLIED OPTICS, 1983, 22 (24): : 4105 - 4110
  • [2] NEW APPROACH TO OPTICAL ANALYSIS OF ABSORBING THIN SOLID FILMS
    DEMICHELIS, F
    KANIADAKIS, G
    TAGLIAFERRO, A
    TRESSO, E
    APPLIED OPTICS, 1987, 26 (09): : 1737 - 1740
  • [3] Simulation of linear optical losses of absorbing heterogeneous thin solid films
    Stenzel, O
    Lebedev, AN
    Schreiber, M
    Zahn, DRT
    THIN SOLID FILMS, 2000, 372 (1-2) : 200 - 208
  • [4] Diffusion in thin films on the surface of a porous solid
    Holmes, WM
    De Panfilis, C
    Packer, KJ
    MAGNETIC RESONANCE IMAGING, 2001, 19 (3-4) : 525 - 526
  • [5] ELLIPSOMETRIC STUDIES ON HIGH-ABSORBING FILMS ON SILICON SURFACE
    BELINSKA, AA
    KALNYNYA, RP
    FELTYN, IA
    OPTIKA I SPEKTROSKOPIYA, 1979, 46 (02): : 317 - 320
  • [6] CHARACTERIZATION OF THIN ABSORBING FILMS USING INFRARED SURFACE-PLASMONS
    YANG, FZ
    BRADBERRY, GW
    JARVIS, DJ
    SAMBLES, JR
    JOURNAL OF MODERN OPTICS, 1990, 37 (05) : 977 - 991
  • [7] Thin films of cellulose for studies in surface chemistry
    Spence, Kelley L.
    Jeong, Changwoo
    Rojas, Orlando J.
    Argyropoulos, Dimitris S.
    Deinhammer, Randall
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2006, 231
  • [8] Effect of surface treatments on absorptance and morphology of molybdenum and silica absorbing thin films
    Oliveira, Aline da Silva
    de Sousa, Gustavo Cesar Pamplona
    Valenca, Antonio Karlos Araujo
    Neto, Jose Felix da Silva
    Gomes, Kelly Cristiane
    SOLAR ENERGY, 2023, 254 : 158 - 167
  • [9] In situ measurements of surface homogeneity of optical parameters of weakly absorbing thin films
    Spousta, J
    Urbánek, M
    Chmelík, R
    Jiruse, J
    Zlámal, J
    Navrátil, K
    Nebojsa, A
    Sikola, T
    SURFACE AND INTERFACE ANALYSIS, 2002, 34 (01) : 664 - 667
  • [10] VALIDITY OF ELLIPSOMETRY FOR DETERMINING AVERAGE THICKNESS OF THIN DISCONTINUOUS ABSORBING SURFACE FILMS
    BENNETT, HE
    BURGE, DK
    PECK, RL
    BENNETT, HE
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1969, 59 (04) : 499 - &