X-RAY-DIFFRACTION CHARACTERIZATION OF AMORPHOUS POLY(PROPYLENE)

被引：0
|
作者：
MARIGO, A
MAREGA, C
ZANETTI, E
ZANNETTI, R
PAGANETTO, G
机构：
[1] UNIV PADUA, DIPARTIMENTO CHIM INORGAN MET ORGAN & ANALIT, VIA LOREDAN 4, I-35131 PADUA, ITALY
[2] HIMONT ITALIA SPA, CTR RICERCHE GIULIO NATTA, FERRARA, ITALY
来源：
MAKROMOLEKULARE CHEMIE-MACROMOLECULAR CHEMISTRY AND PHYSICS | 1991年 / 192卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
The differential radial distribution functions of a sample of amorphous (atactic) poly(propylene) and of an isotactic one were compared, showing the absence, in the former sample, of interatomic correlations beyond 8 angstrom (1 angstrom = 0,1 nm). The influence of the length of atactic and isotactic chain segments on the calculated X-ray interference functions was investigated. A model based on the arrangement of atactic chains in close-packed spheres fits well the experimental X-ray diffraction pattern of the amorphous sample.
引用
收藏
页码：523 / 529
页数：7
相关论文
共 50 条
  • [21] X-RAY-DIFFRACTION
    PFLUGER, CE
    ANALYTICAL CHEMISTRY, 1974, 46 (05) : R469 - R478
  • [22] X-RAY-DIFFRACTION
    SAGURTON, JR
    GIORDANO, J
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (01): : 102 - 102
  • [23] X-RAY-DIFFRACTION
    SMITH, DK
    SMITH, KL
    ANALYTICAL CHEMISTRY, 1982, 54 (05) : R156 - R165
  • [24] X-RAY-DIFFRACTION
    PFLUGER, CE
    ANALYTICAL CHEMISTRY, 1976, 48 (05) : R362 - R368
  • [25] X-RAY-DIFFRACTION
    WINSTANLEY, R
    CHEMISTRY IN BRITAIN, 1975, 11 (12) : 440 - 440
  • [26] X-RAY-DIFFRACTION
    PFLUGER, CE
    ANALYTICAL CHEMISTRY, 1978, 50 (05) : R161 - R166
  • [27] X-RAY-DIFFRACTION CHARACTERIZATION OF MULTILAYER SEMICONDUCTOR STRUCTURES
    VREELAND, T
    PAINE, BM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (06): : 3153 - 3159
  • [28] X-RAY-DIFFRACTION CHARACTERIZATION OF IRIDIUM DIOXIDE ELECTROCATALYSTS
    BENEDETTI, A
    POLIZZI, S
    RIELLO, P
    DEBATTISTI, A
    MALDOTTI, A
    JOURNAL OF MATERIALS CHEMISTRY, 1991, 1 (04) : 511 - 515
  • [29] CHARACTERIZATION OF THIN-FILMS - BY X-RAY-DIFFRACTION
    ISHERWOOD, BJ
    GEC-JOURNAL OF SCIENCE & TECHNOLOGY, 1977, 43 (03): : 111 - 124
  • [30] SURFACE CHARACTERIZATION OF MULTILAYER X-RAY-DIFFRACTION SPECIMENS
    BURKHALTER, PG
    BROWN, DB
    GILFRICH, JV
    KONNERT, JH
    DANTONIO, P
    ROSENSTOCK, H
    SHIREY, LM
    THOMPSON, M
    ELINGS, V
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 845 - 852
12345