MINORITY-CARRIER LIFETIME IN SINGLE CRYSTALLINE SILICON BY SURFACE PHOTO-VOLTAGE MEASUREMENTS

被引：0
|
作者：
CHU, TL [1 ]
STOKES, ED [1 ]
机构：
[1] SO METHODIST UNIV,DALLAS,TX 75275
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1978年 / 125卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
引用
收藏
页码：C135 / C136
页数：2
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