PRECISION ABSOLUTE THIN-FILM STANDARD REFERENCE TARGETS FOR RUTHERFORD BACKSCATTERING MICROANALYSIS

被引：29
|
作者：
RIGO, S [1 ]
COHEN, C [1 ]
LHOIR, A [1 ]
BACKELANDT, E [1 ]
机构：
[1] THOMSON CSF,CENT RES LAB,F-91401 ORSAY,FRANCE
来源：
NUCLEAR INSTRUMENTS & METHODS | 1978年 / 149卷 / 1-3期
关键词：
D O I：
10.1016/0029-554X(78)90958-8
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：721 / 726
页数：6
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