PRECISION ABSOLUTE THIN-FILM STANDARD REFERENCE TARGETS FOR RUTHERFORD BACKSCATTERING MICROANALYSIS

被引：29
|
作者：
RIGO, S [1 ]
COHEN, C [1 ]
LHOIR, A [1 ]
BACKELANDT, E [1 ]
机构：
[1] THOMSON CSF,CENT RES LAB,F-91401 ORSAY,FRANCE
来源：
NUCLEAR INSTRUMENTS & METHODS | 1978年 / 149卷 / 1-3期
关键词：
D O I：
10.1016/0029-554X(78)90958-8
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：721 / 726
页数：6
相关论文
共 50 条
  • [1] PRECISION ABSOLUTE THIN-FILM STANDARD REFERENCE TARGETS FOR NUCLEAR-REACTION MICROANALYSIS OF OXYGEN ISOTOPES .1. O-16 STANDARDS
    AMSEL, G
    NADAI, JP
    ORTEGA, C
    RIGO, S
    SIEJKA, J
    NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 705 - 712
  • [2] Thin-film morphology and Rutherford backscattering spectrometry
    Hahn, T
    Metzner, H
    Gossla, M
    Conrad, J
    MATERIALS SCIENCE APPLICATIONS OF ION BEAM TECHNIQUES, 1997, 248-2 : 409 - 412
  • [3] RUTHERFORD BACKSCATTERING FOR THIN-FILM AND SURFACE-ANALYSIS
    GRANT, WA
    VACUUM, 1984, 34 (3-4) : 489 - 489
  • [4] PRECISION ABSOLUTE THIN-FILM STANDARD REFERENCE TARGETS FOR NUCLEAR-REACTION MICROANALYSIS OF OXYGEN ISOTOPES .2. O-18 AND O-17 STANDARDS
    AMSEL, G
    NADAI, JP
    ORTEGA, C
    SIEJKA, J
    NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 713 - 720
  • [5] Researching thin-film electrode dynamics through Rutherford Backscattering
    Banks, Olajide
    Hinson, Julian
    Peasle, Graham
    DeYoung, P. A.
    Brown, Kenneth
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2013, 245
  • [6] PRECISION STANDARD REFERENCE TARGETS FOR MICROANALYSIS BY NUCLEAR-REACTIONS
    AMSEL, G
    DAVIES, JA
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 177 - 182
  • [7] NiTi thin film characterization by Rutherford backscattering spectrometry
    Goldberg, F
    Knystautas, EJ
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1996, 40 (2-3): : 185 - 189
  • [8] THIN-FILM CHARACTERIZATION BY NUCLEAR MICROANALYSIS
    ZIEGLER, JF
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (01): : 153 - 159
  • [9] Study of Multilayer Thin Film Structures by Rutherford Backscattering Spectrometry
    Bachurin, V. I.
    Melesov, N. S.
    Parshin, E. O.
    Rudy, A. S.
    Churilov, A. B.
    TECHNICAL PHYSICS LETTERS, 2019, 45 (06) : 609 - 612
  • [10] Study of Multilayer Thin Film Structures by Rutherford Backscattering Spectrometry
    V. I. Bachurin
    N. S. Melesov
    E. O. Parshin
    A. S. Rudy
    A. B. Churilov
    Technical Physics Letters, 2019, 45 : 609 - 612
12345