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- [41] Modelling the excess noise due to avalanche multiplication in (hetero-junction) bipolar transistors PROCEEDING OF THE 2004 BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING, 2004, : 108 - 111
- [42] Analysis of avalanche multiplication and breakdown in GaInP/GaAs composite double heterojunction bipolar transistors EDMO 2002: 10TH IEEE INTERNATIONAL SYMPOSIUM ON ELECTRON DEVICES FOR MICROWAVE AND OPTOELECTRONIC APPLICATIONS, 2002, : 220 - 225
- [43] A PHYSICAL MODEL FOR INTEGRATED STRESS-SENSING BIPOLAR-TRANSISTORS SOVIET MICROELECTRONICS, 1988, 17 (04): : 209 - 215
- [46] DEVELOPMENT OF A 2ND BREAKDOWN MODEL FOR BIPOLAR-TRANSISTORS CONFERENCE RECORD OF THE 1989 IEEE INDUSTRY APPLICATIONS SOCIETY ANNUAL MEETING, PTS 1-2, 1989, : 1243 - 1247