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- [1] METHOD FOR MEASURING THE FIELD FROM A MAGNETIC RECORDING HEAD IN THE SCANNING ELECTRON-MICROSCOPE JOURNAL OF MICROSCOPY-OXFORD, 1983, 130 (APR): : RP1 - RP2
- [2] APPLICATION OF AC MAGNETIC-FIELD COMPENSATION TO A SCANNING ELECTRON-MICROSCOPE JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (06): : 490 - 495
- [3] DISTRIBUTION AND INSTABILITY MEASUREMENTS OF MAGNETIC-FIELD IN ELECTRON-MICROSCOPE LENS COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B, 1973, 277 (20): : 603 - 606
- [7] RELATIONSHIP BETWEEN TYPE-1 MAGNETIC CONTRAST IN THE SCANNING ELECTRON-MICROSCOPE AND THE VECTOR POTENTIAL OF THE MAGNETIC-FIELD JOURNAL OF MICROSCOPY-OXFORD, 1986, 144 : RP1 - RP2
- [8] MAGNETIC FORCE MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1993, 11 (06): : 3092 - 3098
- [10] MEASUREMENT OF FRINGING FIELD OF A MAGNETIC RECORDING HEAD USING AN ELECTRON MICROSCOPE JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (08): : 567 - &