IN-SITU PHOTOLUMINESCENCE AND PHOTOMODULATED INFRARED STUDY OF POROUS SILICON DURING ETCHING AND IN AMBIENT

被引:0
|
作者
DUBIN, VM
CHAZALVIEL, JN
OZANAM, F
机构
关键词
D O I
暂无
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Porous silicon etched in HF without air exposure after preparation does not exhibit the well-known red photoluminescence, but a weak yellow-green emission is observed instead. The electron states whose population is affected by light excitation have been investigated using photomodulated infrared spectroscopy. For the yellow-green luminescent samples in HF, the photoinduced infrared absorption has a shape typical of free carriers; it is very large and appears correlated with photoluminescence intensity, suggesting that the yellow-green photoluminescence is due to direct recombination of the photocreated free carriers. For air-exposed red luminescent samples, the photoinduced infrared absorption is much weaker, and its shape exhibits an extra absorption in the 1500-3000cm(-1) region, suggesting that the red luminescence occurs through carriers trapped in localized states.
引用
收藏
页码:61 / 65
页数:5
相关论文
共 50 条
  • [31] In situ photoluminescence studies of photochemically grown porous silicon
    Kolasinski, KW
    Barnard, JC
    Koker, L
    Ganguly, S
    Palmer, RE
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2000, 69 : 157 - 160
  • [32] Single beam determination of porosity and etch rate in situ during etching of porous silicon
    Foss, S.E., 1600, American Institute of Physics Inc. (97):
  • [33] Single beam determination of porosity and etch rate in situ during etching of porous silicon
    Foss, SE
    Kan, PYY
    Finstad, TG
    JOURNAL OF APPLIED PHYSICS, 2005, 97 (11)
  • [34] PHOTOLUMINESCENCE FROM POROUS SILICON BY INFRARED MULTIPHOTON EXCITATION
    CHIN, RP
    SHEN, YR
    PETROVAKOCH, V
    SCIENCE, 1995, 270 (5237) : 776 - 778
  • [35] In-situ characterization of the surface state density by photoluminescence during electrochemical treatments of silicon surfaces
    Dittrich, T
    Timoshenko, VY
    Rappich, J
    ELECTROCHEMICAL SYNTHESIS AND MODIFICATION OF MATERIALS, 1997, 451 : 203 - 208
  • [36] Oxide Formation and Dissolution on Silicon in KOH Electrolyte: An In-Situ Infrared Study
    Philipsen, H. G. G.
    Ozanam, F.
    Allongue, P.
    Kelly, J. J.
    Chazalviel, J. -N.
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2016, 163 (05) : H327 - H338
  • [37] IN-SITU FT-IR STUDY OF P-TYPE POROUS SILICON DURING ELECTROLUMINESCENCE PROCESS
    KONDO, T
    KIM, YY
    UOSAKI, K
    DENKI KAGAKU, 1994, 62 (06): : 540 - 541
  • [38] IN-SITU MONITORING OF INTERNAL SURFACE-AREA DURING THE GROWTH OF POROUS SILICON
    PETER, LM
    RILEY, DJ
    WIELGOSZ, RI
    APPLIED PHYSICS LETTERS, 1995, 66 (18) : 2355 - 2357
  • [39] Metal-aided electrochemical etching of silicon for ambient red to blue photoluminescence
    Suh, KY
    Kim, YS
    Park, SY
    Lee, HH
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2001, 148 (06) : C439 - C442
  • [40] In-situ photoluminescence, Raman, and IR spectral study of porous silicon during exposure to thermoelectrons/H atoms, /H2O and /O3
    Wadayama, T
    Arigane, T
    Hatta, A
    MATERIALS TRANSACTIONS, 2003, 44 (07) : 1394 - 1399