SURFACE CHARACTERIZATION OF CERAMIC MEMBRANES BY ATOMIC-FORCE MICROSCOPY

被引：32

作者：

BOTTINO, A

CAPANNELLI, G

GROSSO, A

MONTICELLI, O

CAVALLERI, O

ROLANDI, R

SORIA, R

机构：

[1] UNIV GENOA,DIPARTIMENTO FIS,I-16146 GENOA,ITALY

[2] SOC CERAM TECH,F-65460 BAZET,FRANCE

来源：

JOURNAL OF MEMBRANE SCIENCE | 1994年 / 95卷 / 03期

关键词：

ATOMIC FORCE MICROSCOPY; CERAMIC MEMBRANES; SURFACE FEATURES;

D O I：

10.1016/0376-7388(94)00132-4

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

Atomic force microscopy (AFM) has been used to investigate the surface of ultrafiltration and microfiltration ceramic membranes. The AFM has been shown to resolve the feature of the gamma-Al2O3 selective skin layer of ultrafiltration membranes providing information on both the size and shape of the gamma-Al2O3 particles as well as the surface roughness of the skin. When applied to study alpha-Al2O3 microfiltration membranes the AFM has been shown to yield results very similar to those obtained by conventional scanning electron microscopy.

引用

页码：289 / 296

页数：8

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