共 50 条
- [11] GRAIN-GROWTH AND STRESS RELIEF IN THIN-FILMS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (01): : 520 - &
- [19] ELLIPSOMETRIC MEASUREMENT OF THIN SILICON FILMS ON EVAPORATED ALUMINUM-COPPER JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (01): : 122 - 124