THE ELECTRON-DENSITY DISTRIBUTION IN ALPHA-TIN FROM POWDER X-RAY DATA BY THE MAXIMUM-ENTROPY METHOD

被引:2
|
作者
NAKAHIGASHI, K [1 ]
HIGASHIMINE, K [1 ]
机构
[1] JAIST,HOKURIKU,ISHIKAWA 92312,JAPAN
关键词
D O I
10.1088/0953-8984/7/34/018
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The electron density distribution map of alpha-tin has been drawn by the maximum-entropy method (MEM) with 11 independent and two combined structure factors, which were determined by the powder pattern decomposition from x-ray data. The final R and R(u), factors were 0.80% and 0.89%, respectively, though a small amount of beta-tin was contained in the specimen. The obtained map indicates that the bonding electrons are clearly seen between the two adjacent tin atoms in the (110) plane with the 0.6 e Angstrom(-3) level. This value was about twice that of germanium. The structure factor F(222)e(-M) for the 222 forbidden reflections at 293 K calculated from the MEM density is +0.4350. The results are discussed by comparing with the electron density maps of C (diamond), Si and Ge.
引用
收藏
页码:6961 / 6966
页数:6
相关论文
共 50 条
  • [41] ELECTRON-DENSITY DISTRIBUTION IN HEMATITE ALPHA-FE2O3, FROM PRECISION X-RAY-DIFFRACTION DATA
    ANTIPIN, MI
    TSIRELSON, VG
    FLUGGE, MP
    GERR, RG
    STRUCHKOV, IT
    OZEROV, RP
    DOKLADY AKADEMII NAUK SSSR, 1985, 281 (04): : 854 - 857
  • [42] ELECTRON-DENSITY DISTRIBUTION IN CUMULENES - LOW-TEMPERATURE X-RAY STUDY OF TETRAPHENYLBUTATRIENE
    BERKOVITCHYELLIN, Z
    LEISEROWITZ, L
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1975, 97 (19) : 5627 - 5628
  • [43] A STUDY OF HIGH-RESOLUTION X-RAY-SCATTERING DATA EVALUATION BY THE MAXIMUM-ENTROPY METHOD
    MULLER, JJ
    HANSEN, S
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1994, 27 : 257 - 270
  • [44] EXTRACTION OF ELECTRON-DENSITY MATRIX FROM X-RAY-DIFFRACTION DATA
    PIERRE, C
    LEROY, G
    MAGNUS, A
    ANNALES DE LA SOCIETE SCIENTIFIQUE DE BRUXELLES SERIES 1-SCIENCES MATHEMATIQUES ASTRONOMIQUES ET PHYSIQUES, 1977, 91 (01): : 39 - 53
  • [45] The phase problem in the analysis of X-ray diffraction data in terms of electron-density distributions
    ElHaouzi, A
    Hansen, NK
    LeHenaff, C
    Protas, J
    ACTA CRYSTALLOGRAPHICA SECTION A, 1996, 52 : 291 - 301
  • [46] ELECTRON-DENSITY FROM X-RAY-DIFFRACTION
    COPPENS, P
    ANNUAL REVIEW OF PHYSICAL CHEMISTRY, 1992, 43 : 663 - 692
  • [47] THE ACCURACY OF ELECTRON-DENSITY MAPS IN X-RAY STRUCTURE ANALYSIS
    COX, EG
    CRUICKSHANK, DWJ
    ACTA CRYSTALLOGRAPHICA, 1948, 1 (1-6): : 92 - 93
  • [48] MAXIMUM ENTROPY DETERMINATION OF THE ELECTRON DISTRIBUTION OF THE Si(111) 7X7 SURFACE FROM X-RAY AND ELECTRON-DIFFRACTION DATA.
    Carvalho, C. A. M.
    Ghosh, A.
    Robinson, I. K.
    Hashizume, H.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1996, 52 : C459 - C459
  • [49] SYNCHROTRON X-RAY STUDY OF THE ELECTRON-DENSITY IN ALPHA-AL2O3
    MASLEN, EN
    STRELTSOV, VA
    STRELTSOVA, NR
    ISHIZAWA, N
    SATOW, Y
    ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1993, 49 : 973 - 980
  • [50] SYNCHROTRON X-RAY STUDY OF THE ELECTRON-DENSITY IN ALPHA-FE2O3
    MASLEN, EN
    STRELTSOV, VA
    STRELTSOVA, NR
    ISHIZAWA, N
    ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1994, 50 : 435 - 441