CHARACTERIZATION OF CDTE CRYSTALS GROWN UNDER MICROGRAVITY CONDITIONS

被引：7
|
作者：
SIFFERT, P [1 ]
BIGLARI, B [1 ]
SAMIMI, M [1 ]
HAGEALI, M [1 ]
KOEBEL, JM [1 ]
NITSCHE, R [1 ]
BRUDER, M [1 ]
DIAN, R [1 ]
SCHONHOLZ, R [1 ]
机构：
[1] UNIV FREIBURG,INST KRISTALLOG,D-7800 FREIBURG,FED REP GER
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1989年 / 283卷 / 02期
关键词：
D O I：
10.1016/0168-9002(89)91386-7
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：363 / 369
页数：7
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