AUGER-ELECTRON SPECTROSCOPIC ANALYSIS OF CHEMICAL-VAPOR-DEPOSITED DIAMOND SUBSTRATE INTERFACES

被引：23
|
作者：
CHIA, QS
YOUNES, CM
PARTRIDGE, PG
ALLEN, GC
MAY, PW
REGO, CA
机构：
[1] UNIV BRISTOL,CTR INTERFACE ANAL,BRISTOL BS8 1TH,AVON,ENGLAND
[2] UNIV BRISTOL,SCH CHEM,BRISTOL BS8 1TH,AVON,ENGLAND
来源：
JOURNAL OF MATERIALS SCIENCE | 1994年 / 29卷 / 24期
关键词：
D O I：
10.1007/BF00353995
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Auger electron spectroscopy has been used to identify the allotropes of carbon in chemical vapour deposited diamond films deposited on copper and tungsten wires and on SiC and silica fibres and to measure the thickness and composition of the diamond/substrate reaction layers. The significance of these results for the manufacture of diamond fibres is discussed.
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页码：6397 / 6402
页数：6
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