A QUANTUM APPROACH TO X-RAY MULTIPLE DIFFRACTION

被引：1
|
作者：
LUH, SW
CHANG, SL
机构：
来源：
ACTA CRYSTALLOGRAPHICA SECTION A | 1988年 / 44卷
关键词：
D O I：
10.1107/S0108767388003666
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：662 / 667
页数：6
相关论文
共 50 条
  • [41] A study of X-ray multiple diffraction by means of section topography
    Kohn, V. G.
    Smirnova, I. A.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2015, 71 : 519 - 525
  • [42] ANALYSIS OF INTERFACIAL MISFIT DISLOCATION BY X-RAY MULTIPLE DIFFRACTION
    MORELHAO, SL
    CARDOSO, LP
    SOLID STATE COMMUNICATIONS, 1993, 88 (06) : 465 - 469
  • [43] X-ray multiple diffraction as a new approach to structural characterization of III-nitride layers
    Kyutt, R. N.
    Scheglov, M. P.
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 10, NO 3, 2013, 10 (03): : 476 - 480
  • [44] High resolution X-ray diffraction, X-ray multiple diffraction and cathodoluminescence as combined tools for the characterization of substrates for epitaxy: the ZnO case
    Martinez-Tomas, M. C.
    Hortelano, V.
    Jimenez, J.
    Wang, B.
    Munoz-Sanjose, V.
    CRYSTENGCOMM, 2013, 15 (19): : 3951 - 3958
  • [45] Structural investigations of epitaxial InN by x-ray photoelectron diffraction and x-ray diffraction
    Hofstetter, Daniel
    Despont, Laurent
    Garnier, M. Gunnar
    Baumann, Esther
    Giorgetta, Fabrizio R.
    Aebi, Philipp
    Kirste, Lutz
    Lu, Hai
    Schaff, William J.
    APPLIED PHYSICS LETTERS, 2007, 90 (19)
  • [46] Chemical analysis by x-ray diffraction - Classification and use of x-ray diffraction patterns
    Hanawalt, JD
    Rinn, HW
    Frevel, LK
    INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION, 1938, 10 : 0457 - 0512
  • [47] X-ray diffraction in thermal treatments: Determination of residual austenite by X-ray diffraction
    Bach, M
    Broll, N
    Cornet, A
    Gaide, L
    JOURNAL DE PHYSIQUE IV, 1996, 6 (C4): : 887 - 895
  • [48] X-RAY DIFFRACTION ANALYSIS BY FLUORESCENT X-RAY APPARATUS
    YONEDA, M
    JAPAN ANALYST, 1970, 19 (11): : 1559 - &
  • [49] Thickness and composition determination of MBE grown strained multiple quantum well structures by x-ray diffraction
    Usher, BF
    Zhou, D
    FOURTH INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS, 2000, 4086 : 76 - 81
  • [50] Analysis of abnormal x-ray diffraction peak broadening from InGaAs/GaAs multiple quantum wells
    Kim, I
    Choe, BD
    Park, SK
    Jeong, WG
    JOURNAL OF APPLIED PHYSICS, 1997, 82 (10) : 4865 - 4869
12345