QUICK MEASUREMENT OF PARAMETERS-DELTA AND PARAMETER-ALPHA OF THE REFRACTIVE-INDEX PROFILE IN THE PREFORMS AND WAVE-GUIDES - GENERALIZED SHEARING METHODS

被引：0
|
作者：
KOWALIK, W
机构：
来源：
OPTICA APPLICATA | 1990年 / 20卷 / 04期
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D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A quick method of measurement of parameters DELTA and alpha describing the refractive index profile for preforms and light waveguides has been presented. The interference methods of both transversal and radial shearing have been described as far as being related to the problem. The proposed method makes it possible to apply a very simple scanning of the interferograms and the calculations are reduced to determination of the coefficients to the given equations.
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页码：321 / 337
页数：17
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