X-RAY-DIFFRACTION PROFILE ANALYSIS IN HEXAGONAL CADMIUM FILMS VACUUM-EVAPORATED FROM NORMAL AND OBLIQUE VAPOR INCIDENCE

被引：6
|
作者：
SEN, S [1 ]
GUPTA, SPS [1 ]
机构：
[1] INDIAN ASSOC CULTIVAT SCI,DEPT GEN PHYS & XRAYS,CALCUTTA 700032,INDIA
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1979年 / 16卷 / 01期
关键词：
D O I：
10.1116/1.569866
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：42 / 53
页数：12
相关论文
共 50 条
  • [41] ANALYSIS OF THE STRAIN PROFILE IN THIN AU/NI MULTILAYERS BY X-RAY-DIFFRACTION
    CHAUDHURI, J
    GONDHALEKAR, V
    JANKOWSKI, AF
    JOURNAL OF APPLIED PHYSICS, 1992, 71 (08) : 3816 - 3820
  • [42] A study of cadmium sulfide nanocrystalline films by grazing incidence X-ray diffraction
    N. S. Kozhevnikova
    A. A. Rempel
    F. Hergert
    A. Magerl
    Russian Journal of Physical Chemistry A, 2007, 81 : 768 - 772
  • [43] TEMPERING TREATMENT STUDY OF 2 STEELS BY X-RAY-DIFFRACTION PROFILE ANALYSIS
    JI, N
    LEBRUN, JL
    BONNIN, J
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1989, 8 (10) : 1127 - 1130
  • [44] A VARIANCE ANALYSIS OF BROADENED X-RAY DIFFRACTION LINES FROM EVAPORATED THIN FILMS OF ALUMINIUM
    GRIMES, NW
    PEARSON, JM
    FANE, RW
    NEAL, WEJ
    PHILOSOPHICAL MAGAZINE, 1970, 21 (169): : 177 - &
  • [45] A study of cadmium sulfide nanocrystalline films by grazing incidence X-ray diffraction
    Kozhevnikova, N. S.
    Rempel, A. A.
    Hergert, F.
    Magerl, A.
    RUSSIAN JOURNAL OF PHYSICAL CHEMISTRY A, 2007, 81 (05) : 768 - 772
  • [46] FOURIER-ANALYSIS OF X-RAY-DIFFRACTION PROFILES OBTAINED FROM SPUTTERED TANTALUM FILMS
    KOIKE, RT
    SHINTANI, M
    THIN SOLID FILMS, 1977, 43 (03) : 235 - 241
  • [47] DYNAMIC X-RAY-DIFFRACTION FROM SUPERLATTICES UNDER GRAZING-INCIDENCE
    MELYKYAN, OG
    IMAMOV, RM
    NOVIKOV, DV
    FIZIKA TVERDOGO TELA, 1992, 34 (05): : 1572 - 1579
  • [48] X-ray diffraction line profile analysis of polyvinyl alcohol capped cadmium sulphide nanostructured films
    Mochahari, P. K.
    Sarma, K. C.
    INDIAN JOURNAL OF PHYSICS, 2014, 88 (12) : 1265 - 1270
  • [49] X-ray diffraction line profile analysis of polyvinyl alcohol capped cadmium sulphide nanostructured films
    P. K. Mochahari
    K. C. Sarma
    Indian Journal of Physics, 2014, 88 : 1265 - 1270
  • [50] X-RAY-DIFFRACTION FROM STRIATED MUSCLES AND NERVES IN NORMAL AND DYSTROPHIC MICE
    KURG, T
    STINSON, RH
    MILLMAN, BM
    MUSCLE & NERVE, 1982, 5 (03) : 238 - 246
12345