共 50 条
- [1] EXPERIMENTAL CHARACTERIZATION OF MOSTS SCALED DOWN TO THE 1-MU-M LEVEL MICROELECTRONICS AND RELIABILITY, 1980, 20 (06): : 803 - 822
- [10] ABSOLUTE CALIBRATION OF PHOTOMETRY AT 1-MU-M THROUGH 5-MU-M ASTRONOMICAL JOURNAL, 1985, 90 (05): : 896 - 899