FOURIER SPECTRUM ANALYSIS OF SUPPORT FILMS FOR HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：0
|
作者：
OIKAWA, T [1 ]
HOJOU, K [1 ]
ISHIGAKI, F [1 ]
KANAYA, K [1 ]
机构：
[1] KOGAKUIN UNIV,DEPT ELECTR ENGN,TOKYO,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1978年 / 27卷 / 04期
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中图分类号：
TH742 [显微镜];
学科分类号：
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页码：363 / 364
页数：2
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