FOURIER SPECTRUM ANALYSIS OF SUPPORT FILMS FOR HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：0

|

作者：

OIKAWA, T ^{[1
]}

HOJOU, K ^{[1
]}

ISHIGAKI, F ^{[1
]}

KANAYA, K ^{[1
]}

机构：

[1] KOGAKUIN UNIV,DEPT ELECTR ENGN,TOKYO,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1978年 / 27卷 / 04期

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中图分类号：

TH742 [显微镜];

学科分类号：

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页码：363 / 364

页数：2

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