TEST STANDARD SPEEDS ON-BOARD PROGRAMMING

被引：0

作者：

AHRENS, K

机构：

[1] Advanced Micro Devices Inc, Sunnyvale, United States

来源：

ELECTRONIC DESIGN | 1994年 / 42卷 / 23期

关键词：

Finite automata;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The IEEE 1149.1 standard (commonly referred to as JTAG, after the Joint Test Action Group, which initiated the process) was developed to test PC-board trace continuity without using physical probes. A set of serially connected cells capture and drive data, which can be shifted out serially and compared with experimental results. The JTAG circuitry includes various registers and a finite, synchronous state machine controlled by dedicated pins.

引用

页码：107 / &

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