TEST STANDARD SPEEDS ON-BOARD PROGRAMMING

被引：0
|
作者：
AHRENS, K
机构：
[1] Advanced Micro Devices Inc, Sunnyvale, United States
来源：
ELECTRONIC DESIGN | 1994年 / 42卷 / 23期
关键词：
Finite automata;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The IEEE 1149.1 standard (commonly referred to as JTAG, after the Joint Test Action Group, which initiated the process) was developed to test PC-board trace continuity without using physical probes. A set of serially connected cells capture and drive data, which can be shifted out serially and compared with experimental results. The JTAG circuitry includes various registers and a finite, synchronous state machine controlled by dedicated pins.
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页码：107 / &
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