X-RAY TOPOGRAPHIC ANALYSIS OF DISLOCATION LINE DEFECTS IN SOLUTION GROWN DEUTERATED TRIGLYCINE FLUOBERYLLATE

被引:0
|
作者
NICOLOSI, J
LADELL, J
机构
关键词
D O I
10.1016/0022-0248(80)90071-8
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:120 / 124
页数:5
相关论文
共 50 条
  • [21] X-RAY TOPOGRAPHIC STUDY OF FLUX GROWN KTP CRYSTALS
    HALFPENNY, PJ
    ONEILL, L
    SHERWOOD, JN
    SIMPSON, GS
    YOKOTANI, A
    MIYAMOTO, A
    SASAKI, T
    NAKAI, S
    JOURNAL OF CRYSTAL GROWTH, 1991, 113 (3-4) : 722 - 725
  • [22] X-RAY TOPOGRAPHIC ASSESSMENT OF FLUX GROWN BAFCI CRYSTALS
    SOMAIAH, K
    MOINUDDIN, SR
    RAO, UVS
    BABU, VH
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1983, 2 (07) : 314 - 316
  • [23] X-ray topographic characterization of epitaxially grown diamond film
    Suzuki, CK
    Shinohara, AH
    Godoy, PH
    Watanabe, N
    Kamo, M
    DIAMOND AND RELATED MATERIALS, 1998, 7 (2-5) : 289 - 292
  • [24] X-RAY TOPOGRAPHIC OBSERVATION OF LATTICE DEFECTS IN TGS CRYSTALS
    POLCAROVA, M
    JANTA, J
    CZECHOSLOVAK JOURNAL OF PHYSICS, 1973, B 23 (03) : 331 - +
  • [25] X-RAY TOPOGRAPHIC STUDY OF CRYSTAL DEFECTS IN DOLOMITE AND MAGNESITE
    ZARKA, A
    BULLETIN DE LA SOCIETE FRANCAISE MINERALOGIE ET DE CRISTALLOGRAPHIE, 1969, 92 (02): : 160 - &
  • [26] AN X-RAY TOPOGRAPHIC STUDY OF D-DEFECTS IN SILICON
    VYSOTSKAYA, VV
    GORIN, SN
    SOROKIN, LM
    SHEIKHET, EG
    FIZIKA TVERDOGO TELA, 1987, 29 (06): : 1858 - 1861
  • [28] The features of X-ray topographic contrast formation in silicon with dislocation clusters
    I. M. Fodchuk
    S. N. Novikov
    D. G. Fedortsov
    A. Ya. Struk
    I. V. Yaremchuk
    Crystallography Reports, 2013, 58 : 976 - 983
  • [29] The features of X-ray topographic contrast formation in silicon with dislocation clusters
    Fodchuk, Igor M.
    Novikov, Sergiy M.
    Struk, Andriy Ya.
    TENTH INTERNATIONAL CONFERENCE ON CORRELATION OPTICS, 2011, 8338
  • [30] The features of X-ray topographic contrast formation in silicon with dislocation clusters
    Fodchuk, I. M.
    Novikov, S. N.
    Fedortsov, D. G.
    Struk, A. Ya
    Yaremchuk, I. V.
    CRYSTALLOGRAPHY REPORTS, 2013, 58 (07) : 976 - 983