共 50 条
- [41] MEASURING SPRAY ATOMIZER DROPLET SPECTRUM DOWN TO 0.5 MU-M SIZE TRANSACTIONS OF THE ASAE, 1985, 28 (05): : 1367 - 1370
- [42] 0.25 mu m CMOS/SIMOX gate array LSI 1996 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE, DIGEST OF TECHNICAL PAPERS, 1996, 39 : 86 - 87
- [43] THE 3.3 MU-M AND 3.4 MU-M EMISSION FEATURES IN PLANETARY-NEBULAE ASTRONOMY & ASTROPHYSICS, 1987, 182 (02): : 290 - 298
- [46] LASER-INDUCED DAMAGE PROBABILITY AT 1.06 MU-M AND 0.69 MU-M APPLIED OPTICS, 1973, 12 (04): : 690 - 699
- [50] In-situ gate oxide electrode deposition for a 0.5μm BiCMOS process flow ASMC 98 PROCEEDINGS - 1998 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE AND WORKSHOP: THEME - SEMICONDUCTOR MANUFACTURING: MEETING THE CHALLENGES OF THE GLOBAL MARKETPLACE, 1998, : 174 - 180