ON THE TERM ACTIVATION-ENERGY IN ACCELERATED LIFETIME TESTS OF PLASTIC ENCAPSULATED SEMICONDUCTOR COMPONENTS

被引：3

|

作者：

MOELLER, A

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1980年 / 20卷 / 05期

关键词：

D O I：

10.1016/0026-2714(80)90395-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：651 / 664

页数：14

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