VARIATION OF BRAGG-CASE DIFFRACTION CURVES OF X-RAYS FROM A THIN SILICON CRYSTAL WITH CRYSTAL THICKNESS

被引：11
|
作者：
HASHIZUM.H
NAKAYAMA, K
MATSUSHI.T
KOHRA, K
机构：
来源：
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1970年 / 29卷 / 03期
关键词：
D O I：
10.1143/JPSJ.29.806
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：806 / &
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