SOS DEVICE RADIATION EFFECTS AND HARDENING

被引：17
|
作者：
BUCHANAN, BL
NEAMEN, DA
SHEDD, WM
机构：
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1978年 / 25卷 / 08期
关键词：
D O I：
10.1109/T-ED.1978.19208
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：959 / 970
页数：12
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