JFET/SOS devices: Processing and gamma radiation effects

被引：0
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作者：
Nie, Jiping [1 ]
Liu, Zhongli [1 ]
He, Zhijing [1 ]
Yu, Fang [1 ]
Li, Guohua [1 ]
机构：
[1] Chinese Acad of Sciences, Beijing, China
来源：
International Conference on Solid-State and Integrated Circuit Technology Proceedings | 1998年
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页码：67 / 70
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